Gentec-EO – Laser Power Meter & Laser Energy Meters

Beam Diagnostics
 

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Beam Diagnostics
Specifications
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WEEE/RoHS compliant Low Cost
2-D imaging 		 UV to IR
Large Area X-Y imaging 		 Real Time
X-Y-Z + θ-φ Profiling 		 Affordable
Sub-Micron X-Y Profiling 
Beamage (Focus) BeamScope-P8 BeamMap2 Beam'R2
Description        
Profiling X-Y  X-Y  X-Y-Z  X-Y 
Imaging Digital (CMOS and CCD)  Pinhole with 2D-stage     
Focusing, Pointing, Divergence and Collimating Manual  Manual  Real Time  Manual 
Alignement        
M2 With Optional 2D-Stage  With Pinhole + 2D-stage (optional)  Real Time   
Method        
Pinhole   (with 2D-stage)     
Scanning Slit        
Scanning X-Y Slit        
Slits in multiple planes        
Knife-edge Mode        
CMOS/CCD sensor        
Applications        
CW Lasers        
Pulsed Lasers Up to 20 kHz single capture  > 5 kHz  > 100 kHz  > 100 kHz 
Wavelenght Ranges (nm)        
1 - 350 With UV Converter       
190 - 1100   Si Detector  Si Detector  Si Detector 
260 - 1150 -UV Version       
350 - 1150 Standard       
350 - 1330 -1310 Version       
650 - 1800     InGaAs Detector  InGaAs Detector 
800 - 1800   Ge Detector     
1480- 1680 With CamIR Adapter or -IR       
800 - 2500   Extended InGaAs  Extended InGaAs  Extended InGaAs 
1500 - 4000   InAs Detector     
Features        
Best Resolution 1 µm  0.1 µm  0.5 µm  0.5 µm 
Update Rate 10 - 25 Hz  1 - 2 Hz
(0.01 Hz with 2D-stage) 		 3 Hz (real time)  3 Hz (real time) 

* Specifications subject to change without notice.

Cette section est actuellement
en construction et sera
disponible sous peu.