Gentec-EO – Laser Power Meter & Laser Energy Meters

Beam Diagnostics
 

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Beam Diagnostics
Specifications
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WEEE/RoHS compliant Low Cost
2-D imaging 		 Low Cost
2-D Imaging
For Large Beams 		 Affordable
Sub-Micron X-Y Profiling 		 Real Time
X-Y-Z + θ-φ Profiling 		 UV to IR
Large Area X-Y imaging 
Beamage Beamage-Focus Beam'R2 BeamMap2 BeamScope-P8
Description          
Profiling X-Y  X-Y  X-Y  X-Y-Z-θ-φ  X-Y 
Imaging Digital (CCD)  Digital (CCD)      Pinhole with 2D-stage 
Focusing, Pointing, Divergence and Collimating Manual  Manual  Manual  Real Time  Manual 
Alignement          
M2 With Optional 2D-Stage      Real Time  With Pinhole
+ 2D-stage (optional) 
Method          
Pinhole         (with 2D-stage) 
Scanning Slit          
Scanning X-Y Slit          
Slits in multiple planes          
Knife-edge Mode          
CCD sensor          
Applications          
CW Lasers          
Pulsed Lasers Up to 20 kHz single capture  Up to 20 kHz single capture  > 100 kHz  > 100 kHz  > 10 kHz 
Wavelenght Ranges (nm)          
1 - 350 With UV Converter         
190 - 1150     Si Detector  Si Detector  Si Detector 
260 - 380 -UV Version         
350 - 1150 Standard  Standard       
350 - 1330 -1310 Version  -1310 version       
675 - 1750     InGaAs Detector  InGaAs Detector   
800 - 1800         Ge Detector 
1480- 1680 With CamIR Adapter or -IR         
800 - 2500     Extended InGaAs  Extended InGaAs   
1500 - 3500         InAs Detector 
Features          
Best Resolution 1 µm  1.6 µm  0.5 µm  0.5 µm  0.1 µm 
Update Rate 10 Hz  10 Hz  5 Hz (real time)  5 Hz (real time)  1 - 2 Hz
(0.01 Hz with 2D-stage) 

* Specifications subject to change without notice.

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